SEMESTER-I

EL - 113 Elements of Quantum Computation
Quantum bits, single and multiple Q bit gates, quantum circuits, Q bit copying, Bell states, quantum teleportation, classical computation and quantum computers, quantum parallelism, Dentsch-Joscha algorithm.
Linear algebra, bases, operators, matrices, Pauli matrices, Tensor products, commutator and anti commutator, state space, quantum measurements, Distinguishing quantum states, projective measurements, POVM measurements, density operator, Schmitt decomposition EPR and the Bell inequality.

EL - 114 Characterization Techniques
Introduction to emission and absorption spectroscopy: Nature of electromagnetic radiation, electromagnetic spectrum, atomic, molecular, vibrational and X-ray energy levels, Nuclear and Electron spin behavior.
UV-VIS spectroscopy: Radiation sources, wavelength selection, Cells and sampling devices, Detectors, readout modules, data analysis.

IR spectrometry: Correlation of Infrared spectra with Molecular structure, Instrumentation, sample handling, Quantitative Analysis.

X-ray methods: Production of X-rays and X-ray spectra, Instrumentation, Direct X-ray methods, X-ray absorption, fluorescence and diffraction methods, Energy dispersive X-ray Analysis (EDAX) Auger Emission Spectroscopy, Electron Spectroscopy for Chemical Analysis (ESCA), interpretation of spectra. Mass Spectrometry: Sample flow in mass spectrometer, inlet sample system, ionization methods, mass analysers, ion collection systems, data handling, vacuum system, correlation of mass spectra with molecular structure, secondary ion mass spectrometry (SIMS).

Ellipsometry: optical parameter measurements (n and k), thickness measurements.

Microscopic Techniques: optical microscope, Scanning Electron Microscope (SEM), Transmission Electron microscope (TEM ), Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Other measuring techniques: Thickness measurement ? gravimetric method, fitzeau fringe method, tally step method etc, Adhesion ? contact angle, tape, scratch, strain / stress methods.

Measurement of electrical parameters of semiconductor materials, resistivity, mobility, carrier concentration, carrier type.

EL - 115 Advanced Test & Measurement Instruments
Review of Test and Measurement instruments- multimeters, LCR meters, function generators, CRO, probes and power supplies.
Block diagram, working principle and procedure of operation of Digital Storage Oscilloscopes, mixed signal oscilloscopes, Arbitrary waveform generators, RF generators, RF power meter, DC electronic load.

Electrometer, EMI/EMC Tester, Spectrum analyzers, Impedance analyzer, Vector signal analyzer, Network analyzers, Logic analyzer, Automatic test equipment - PCB test and Inspection system, Semiconductor parameter analyzer.

EL - 116 Computational Methods in Electronics
Numerical methods for solution of simultaneous equations, LU factorization, Pivotal condensation and Gauss -Jordan methods of matrix inversion, applications in network analysis.
Iterative algorithms, solving equations and finding roots, practical considerations of convergence rate and accuracy.

Curve fitting: Regression, Least square, Polynomial,Lagrangian interpolation, Newtons divided difference, Splines Quadratic, Cubic Splines.

Numerical methods for solution of differential, partial differential and integral equations, Euler's method, Runge-Kutta method, Numerical integration, differentiation, Simpson's 1/3 rule, Gauss quadrature formula, Euler Maclaurine formula.

Finite difference and finite element methods, applications in solution of Poisson's equation, driftdiffusion transport process, propagation of E.M. waves etc.

EL - 117 Electronic Instrument Design
Development cycle of an Electronic Instrument ? System engineering, architecting, concept development, documentation, teamwork, design development, validation, verification and integration, Rapid prototyping, Field testing, failure, iteration and judgment.
Documentation types, methods, layouts, audience oriented preparation, presentation and preservation.

Instrument-human interface, user centered design, ergonomics, utility, principles of appropriate operation, Case studies.

Packaging and enclosures-design for manufacturing, assembly and disassembly, Wiring, temperature, vibration and shock, rugged systems. Grounding and shielding design, safety and noise.

Circuit design, Circuit lay-out, power supplies, power distribution, Cooling ? heat transfer, thermal management, cooling choices-heat sinks, heat pipes and thermal pillows, fans and forced air cooling, liquid cooling, evaporation and refrigeration, Tradeoffs in design.

Integration, production and logistics.

EL - 118 Theory of Industrial Process Control
Introduction to functional elements of control system, control strategies, continuous and discrete state controller, Open loop control systems, Closed loop control systems - feedback, feed forward and adaptive control strategies. Data logger, supervisory and direct digital control systems.
Mathematical models of systems, state variable models, Transfer function, Block diagrams and signal flow-graphs, analysis of state variable models of open and closed loop systems, Mathematical modeling of Physical systems, equations of electric networks, modeling mechanical system elements.

Stability of linear control systems. Methods of determining stability- Routh-Hurwitz stability criterion, root locus and frequency response methods of control system analysis, Bode and Nyquist plots.